Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details? - Archive ouverte HAL Access content directly
Journal Articles Applied Surface Science Year : 2013

Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?

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hal-00861664 , version 1 (13-09-2013)

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  • HAL Id : hal-00861664 , version 1

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P.C. Montgomery, F. Anstotz, B. Serio, D. Montaner. Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?. Applied Surface Science, 2013, 281, pp. 89-95. ⟨hal-00861664⟩
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