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Article Dans Une Revue Nanotechnology Année : 2023

Structural identification of graphene films and nanoislands on 6H-SiC(0001) by direct height measurement

Hamza Ichou
Bulent Baris
  • Fonction : Auteur
Erik Dujardin
David Martrou

Résumé

Abstract By combining non-contact atomic force microscopy (nc-AFM) and Kelvin probe microscopy (KPFM) in ultra high vacuum environment (UHV), we directly measure the height and work function of graphene monolayer on the Si-face of 6H-SiC(0001) with a precision that allows us to differentiate three different types of graphene structures : zero layer graphene (ZLG), Quasi free-standing monolayer graphene (QFMLG) and bilayer graphene (BLG). The height and work function of ZLG are 2.62 ± 0.22 Å and 4.42 ± 0.05 eV respectively, when they are 4.09 ± 0.11 Å and 4.63 ± 0.05 eV for QFMLG. The work function is 4.83 ± 0.05 eV for the BLG. Unlike any other available technique, the local nc-AFM/KPFM dual probe makes it possible to directly identify the nature of nanometer-sized graphene islands that constitute the early nuclei of graphene monolayer grown on 6H-SiC(0001) by chemical vapor deposition.
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Dates et versions

hal-03998136 , version 1 (21-02-2023)

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Paternité - Pas d'utilisation commerciale - Pas de modification

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Hamza Ichou, Mohanad Alchaar, Bulent Baris, Adrien Michon, Roy Dagher, et al.. Structural identification of graphene films and nanoislands on 6H-SiC(0001) by direct height measurement. Nanotechnology, 2023, 34 (16), pp.165703. ⟨10.1088/1361-6528/acb2d0⟩. ⟨hal-03998136⟩
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